Humidity

00°C, 30 to 98% RH, 1520 DUTs, computer controlled)



Model 2061

The Model 2061 is a versatile Humid Environment Burn-in or Life Test system for discrete components.  Although commonly used for a variety of ceramic capacitors other discrete components may also be tested by using appropriate DUT test cards.  Multiple bias supplies allow simultaneous tests of different voltage levels.  

Configuration

The system includes a fixtured test chamber which provides a humidity and elevated-temperature environment.  The Model 2061 provides 21 DUT card positions.  There is an ambient-temperature load/monitor card for each DUT card.  Control equipment includes logic supplies, computer controller, and software.

Test Chamber

The interior of the chamber has a 21-position card rack with interface cabling to the load/monitor card and bias power supply cabinet.  The test temperature is adjustable from 50 to +100°C.  The humidity level is adjustable between 30% and 98% relative.  

Device Test Cards

Device test cards are available for a variety of device packages including, chip, axial lead, radial lead, DIP, and lead frame.  If parametric testing is required, cards featuring four-wire Kelvin circuitry are available.

Fuse Load Cards

There is a series fuse load card position for each DUT card position. The load card has fuses in series with each DUT.

Monitor Cards

Monitor cards contain monitoring circuitry and computer interface circuitry to monitor the fuses on a load card. There is one monitor/load card pair for each DUT card.

Bias Supplies

Any bias supply in power supply cabinet may be connected to any test card through the programmable patch panel. 

Model 2060

The Model 2060 is similar but without computer-aided fuse failure monitoring capability.

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