Mil-Spec Testing

Ceramic Chip Capacitor 
Burn-in and Voltage Conditioning
(To 175°C, 14,400 DUTs)



Model 2030 is an ideal system for mil-spec burn-in and voltage conditioning.  It is designed to meet test circuit requirements of voltage monitoring and interruption.   Timekeeping and LED displays monitor elapsed time and failures.  Device fixturing for 14,400 ceramic chip capacitors is standard.  Other fixturing options are available.

Configuration

The system includes a fixtured chamber, bias supplies, device test cards, and series load cards.   The interior of the test chamber has a 20-position card rack.  An interface assembly for each DUT card connects to load cards in an ambient-temperature rack mounted behind the test chamber. 

Device Fixturing

Daughter Cards. Our daughter card technique reduces handling and labor. The daughter card holds devices for test.  To improve leakage current or I_R measurements, guard circuits are included.  Daughter cards plug into a mother tray, and the mother tray plugs into the system.  

Each daughter card provides individual circuits for each device, so I_R or leakage current measurements may be made while the devices remain fixtured on the card.  This allows the operator to identify failed capacitors. 

Mother Trays. The mother tray holds nine daughter cards.  When inserted into the mother tray, all capacitors on a daughter card are connected as one parallel group. The Model 2030 holds 20 mother trays.

Load Cards

An ambient load card enclosure provides a series load card for each card position inside the test chamber.  Load monitor cards have a voltage monitor for each daughter card and a time keeping function.

If the monitored voltage across a daughter card drops 5%, a failure LED identifies the daughter card. The bias voltage is also removed from the mother tray (all nine daughter cards), and the tray-level elapsed time meter is stopped until an operator clears the fault and resumes the test.  When the test is resumed, the elapsed time meter resumes counting.

Bias Supplies

Three power supplies are standard: 0 to 150 VDC, 0 to 300 VDC, and 0 to 600 VDC.  Other supplies, up to 1,000 VDC, are optional.  A maximum of six supplies may be installed.  A patch panel allows the operator to assign any bias supply to and device test card.

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