Diode HTRB

Diode Burn-in, Life Test,
High Temperature Reverse Bias (HTRB)
(To 200°C, 1600 DUTs)

Model 2110 is a versatile, manually operated, burn-in and life test system ideal for multiple lots of devices. All test parameters are set by the operator via front panel controls. This system is ideally suited to those test situations where tests are started and not monitored until the required test time has elapsed.

Configuration

A complete system includes: a fixtured test chamber, bias supplies, device test cards, and series load cards.

Test Chamber

The interior of the chamber has a 20-position card rack. Each card position has an interface to a load card installed in an ambient-temperature rack mounted to the back of the chamber.

Load Cards

An ambient temperature load card enclosure is mounted on the back of the test chamber. The load card provides a series load for each position of the DUT card inside the test chamber.

Device Test Cards

Device test cards are available for a variety of device packages including axial, chip, and DO/4 and DO/5 packages.

Bias Supplies

Standard systems have up to six supplies. Patch panels allow the connection of bias supplies to any test card.

Back To Life Test and Burn-In

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