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Model 2010 |
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Model 2010 is a versatile manually operated, burn-in / life test system for multiple lots of devices. All test parameters are set by the operator via front panel controls. This system is ideally suited to those test situations where tests are started and not monitored until the required test time has elapsed. Configuration A complete system includes: a fixtured test chamber, bias supplies, device fixturing test cards, and load cards. Test Chamber The interior of the chamber has a 20-position card rack. Each card position has an interface with a load card located outside the test chamber. Load Cards An ambient temperature load card enclosure is mounted to the back of the test chamber. This provides a series load card for each card position inside the test chamber. The load card holds loading components, such as fuses or resistors, in series with each DUT on the card inside the test chamber. Device Test Cards Device test cards are available for a variety of device packages including, chip, axial lead, radial lead, DIP, and lead frame. Cards are usually in an 80-position configuration. Twenty-position cards featuring four-wire Kelvin circuitry are available. Using 80-position test cards, capacity is 1600 DUTs per chamber. Bias Supplies Standard systems have up to six bias supplies. Patch panels allow the connection of bias supplies to any test card.
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