Four-Amp Electromigration Testing
The DM505 instrument modules are now shipping. Use the DM505
electromigration testing on solder bumps or any other high current EM test
requirement.
This instrument is another plug in module for the Micro Instrument Company
line of Process Evaluation Systems. Use it in the PE9000, SPC4000, PE9015,
and the PE9020A. It includes all the great features of the DM500
family of electromigration instrument modules such as parallel processing,
imbedded microprocessor, and proven dependability. For more information
request a datasheet from the Literature Request
page.
Stress Migration
Stress Migration tests are performed by applying thermal stress only to a
structure. Then, at operator-set intervals, resistance is measured to
determine changes caused by the stress. The instrument module monitors and
records the resistance of the structure until the resistance reaches an
operator-set failure level, or until the operator-set maximum test time has been
reached. This is a software upgrade for our DM500 instrument card
family. Contact us for more
information.
High Temperature Device Test Card
Our high temperature device test card is made of porcelain-coated
steel. The most exciting aspect of the card is the replaceable DUT sockets
designed by Micro Instrument Company. Each part of the DUT socket is
individually replaceable. This means the contact pins may be replaced when
necessary, or if a socket body is damaged, it may be replaced. This unique
feature of our cards lengthens their useful life. Get more
information from the Literature Request page.
|