Weibull Testing

Capacitor Weibull Testing
(To 200°C, 1600 DUTs/chamber, 3 chambers test 4800 DUTs total)



The Model 2052 is a reliability test system for tantalum capacitors.  It complies with the guidelines of MIL-39003 and MIL-55365.  It gathers the time-of-failure data necessary for Weibull calculations which are used to project component lifetimes.  The computer monitors series fuses and records failure times associated with fuses opened due to shorted DUT's. .

A complete system includes: a fixtured test chamber, bias supplies, device test cards, series fuse load cards, monitor cards, logic supplies, and a computer controller.

Test Chamber

The interior of the chamber has a 20-position card rack with a through-wall connector assembly to interface to the load monitor cards.

Fuse Load Cards and Monitor Cards

An ambient-temperature load card enclosure is mounted to the back of the test chamber.  This provides a series load card for each card position inside the test chamber.  Separate cards monitor the fuses to identify failures.

Device Test Cards

Device test cards are available for a variety of device packages including, chip, axial lead, radial lead, DIP, and lead frame. Cards are usually in an 80-position configuration and include a guard line for improved leakage current testing. If further parametric testing is a requirement, 20-position cards featuring four-wire Kelvin circuitry are available. Using 80-position test cards gives 1,600 DUTs per chamber.

Bias Supplies

There are five bias supplies installed in the system, allowing five independent tests of different voltage levels.  Patch panels allow the connection of bias supplies to any test card.

Computer Control

The system controller is a desk-top computer with printer and monitor. System software operates up to three chambers.  An on-screen color code provides test status. 

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