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Transistor Testing |
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Transistor Burn-in & Life Test (To 200°C, 1600 DUTs) 
Model 2210 is a versatile, manually operated, burn-in or life test system for multiple lots of devices. All test parameters are set by the operator via front panel controls. This system is ideally suited to those test situations where tests are started and not monitored until the required test time has elapsed. Configuration A complete system includes: a fixtured test chamber, bias supplies, device test cards, and load cards. Test Chamber The interior of the chamber has a 20-position card rack. Each card position has an interface to a load card installed in an ambient-temperature rack mounted to the back of the chamber. Load Cards An ambient temperature load card enclosure is mounted to the back of the test chamber. This provides a series load card for each card position inside the test chamber. The load card has loading components, such as fuses or resistors, in series with each DUT on the card inside the test chamber. Device Test Cards Device test cards are available for a variety of device packages including TO-18, TO-5/39, TO-92/93, TO-126, TO220, and TO3/66. Cards can be 80, 40, or 24 position. Eighty position cards stress one junction per DUT. Forty-position cards allow access to electrical junctions with one common. Twenty-four position cards offer maximum flexibility. Bias Supplies Bias power supplies are used to apply power to the devices under test. Standard systems have up to six supplies. Patch panels allow the connection of bias supplies to any test card.
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