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High Voltage Capacitor Burn-In and Life Test
The Model 7804 is a burn-in or
life test system for high voltage ceramic capacitors. The eight board system
fixtures up to 480 chip or leaded devices. Standard Features include:
- 5,000 Volt DC Bias Supply
- Multiple Bias Supplies
- Bias Voltage Monitoring /
Interrupt
- Gross Leakage Current Monitoring
- 150°C Capability
- Safety Door Interlock Circuits
- Eight Independent Test Lots
- Up To 480 Test Positions
- Tests Many Package Types
- Adjustable Chip Fixturing
Safety
The front door and the door to the bias voltage programming matrix are
automatically locked shut when high voltage is present. These doors are also
locked shut whenever power is not applied to the system. This prevents the doors
from opening during a power failure, because bias voltage may not have decayed
to a safe level. Two conditions must be present before the solenoid locking
devices allow the doors to open: 1) The bias voltage must have decayed to a
safe level, 2) A positive action must be taken by the operator. Other safety
devices include interlock switches for over-temperature protection and loss of
air flow.
Power Supplies
Patch-panel programming allows bias supply programming to DUT cards as needed.
An optional power supply monitor and interrupt system is available; if the voltage changes by more than 5% in either direction, an alarm
sounds, a failure lamp comes on, and bias voltage is removed.
DUT/ Load Cards
The DUT/Load card for chip components has unique fixturing that adjusts to the
size of the capacitor being tested. This reduces the types of cards you need to
keep on hand. In addition to DUT fixturing, the cards contain current-limiting
and leakage-current-monitoring resistors.
Scanning
Standard systems include a manual scanning method to allow leakage current
measurements while the devices remain at temperature inside the test chamber.
For more information
ask for the data sheet and the technical proposal.
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