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H.A.L.T Go/No-Go |
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Capacitor Highly Accelerated Life Test (Go/No-go) (To 200°C, 1600 DUTs / Chamber, 3 chambers test 4800 DUTs total)  Model 2051 is designed specifically for Highly Accelerated Life Test (HALT) of ceramic capacitors. However, the computer control and time keeping capability required for HALT specifications make this system ideal for any test where failure data accuracy and simple system operation are required. The system monitors a fuse in series with each device under test providing a record of fail times. The system's maximum voltage rating is 1,000 volts and includes two or more 600 volt bias supplies. Because multiple bias supplies are installed in the system, tests at different voltages may be run simultaneously. A complete system includes: a fixtured test chamber, bias supplies, device test cards, series fuse load cards, monitor cards, logic supplies, and computer controller. Test Chamber A 20-position DUT card rack is mounted inside the chamber. A through-wall connector assembly for each card position connects to the monitor cards in an external load card enclosure. Fuse Load Cards and Monitor Cards An ambient-temperature load card enclosure is mounted at the back of the test chamber. This provides a series load card for each card position inside the test chamber. The load card has fuses in series with each DUT on the card inside the test chamber. Separate monitor cards interrogate the fuses to identify failures. Device Test Cards Device test cards are available for a variety of device packages including, chip, axial lead, radial lead, DIP, and lead frame. Cards are usually in an 80-position configuration and include a guard line for improved leakage current testing. If further parametric testing is a requirement, 20-position cards featuring four-wire Kelvin circuitry are available. Using 80-position test cards gives 1,600 DUTs per chamber. Bias Supplies Bias power supplies are used to apply power to the devices under test. Standard systems have up to six supplies. Patch panels allow the connection of bias supplies to any test card. Computer Control The system controller is a desk-top computer with printer and monitor. It sets the test parameters, runs the tests, and logs time-of-failure data. System software operates up to three chambers. An on-screen color code provides the operator current test status.
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