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Capacitor Highly Accelerated Life Test 
(Monitored Leakage Current)

(To 200°C. For a 3 chamber system: 3 temperatures, 1200 DUTs/temperature)

CE 9051


Model CE9051 introduces a new dimension in capacitor reliability testing.  Less sophisticated capacitor life test systems provide only the time-of-failure data based on series fuses opening due to  shorted devices.  With the CE9051 the operator sets a maximum leakage current level.  When this current is reached the DUT is considered shorted and its test is terminated.  

In addition to providing time-of-failure data, the Model CE9051 continuously measures and records the leakage current of each DUT.  This information is used to produce accurate leakage current plots.

System Features include:

  • Monitored DC Leakage Current and Time to Failure
  • Operator-Set Test Termination Point
  • Adjustable Stress Voltage to 600 Volts
  • Test to Destruction or Preserve Failure Region
  • Analysis & Reports from Logged Test Data
  • 200°C Maximum Temperature
  • 1200 Test Positions per Chamber
  • Computer Controlled
  • User Calibrated
Preserved Failure Region

Model CE9051 features an electronic fuse circuit for each DUT position.  Instead of testing the capacitor to destruction, the system may be set to preserve the failure site by stopping the test at a specified leakage current level.

Configuration

System architecture features an independent instrument card for each DUT card.  The DM511 Instrument Card has 100 solid-state current measurement circuits, one for each DUT position.  Each circuit contains an electronic fuse and current read-back monitor to measure leakage current.  An on-board microprocessor performs all measurements, signal multiplexing, and termination condition setting and monitoring.  Because each DUT card is associated with an independent Instrument Card, the time between each DUT measurement is unaffected by the number of DUT cards in use.  

Refer to DM511 Instrument Module for further details.


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