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Micro Instrument Company products break out into two primary
categories. These categories are products for Semiconductor Evaluation and
products for life test and burn in. Links to each of these product
categories are provided here. Under each link is a description of the
product types associated with it.
Semiconductor Evaluation
Semiconductor Evaluation equipment includes instrument modules, systems, and
software for process evaluation during the manufacture of semiconductor
products. The tests performed by this class of equipment include
electromigration (EM), stress migration (SM), temperature coefficient of resistance (TCR), time dependent dielectric breakdown (TDDB), oxide tests
including SILC, hot carrier degradation (HCI), and data analysis
tools.
Life Test / Burn-In
Life test and burn-in equipment includes systems and device fixturing
techniques for assessing the quality or reliability of electronic
components. The majority of this equipment line provides testing
capability for all capacitor types to meet the appropriate military or industry specifications to qualify and maintain a product line or process.
High Temperature Reverse Bias (HTRB) systems for diodes and transistors are
also included in this class of product. Forward power test systems for
diodes and transistors are also available.
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